Training: Basics of super resolution microscopy


STED from Leica and Airyscan from Zeiss allow for resolution enhancement, both microscopy methods are available at MIC.

Overview of super resolution microscopy methods, sample preparation. Basics of STED and Airyscan techniques.

Learning outcome:
Participants will learn how to prepare samples and perform STED and Airyscan imaging.

Registration for both days only!


Date: 21.03.2017, time: Registration is for 21 and 22 March 2017, max. participants : 24 (left: 0)


Detailed informations: PDF


Deadline for registrations: 15.03.2017




The registration deadline is over. Registrations are no longer possible.