Training: Basics of super resolution microscopy

 

Background:
STED from Leica and Airyscan from Zeiss allow for resolution enhancement, both microscopy methods are available at MIC.

Content:
Overview of super resolution microscopy methods, sample preparation. Basics of STED and Airyscan techniques.

Learning outcome:
Participants will learn how to prepare samples and perform STED and Airyscan imaging.

Registration for both days only!

 

Date: 21.03.2017, time: Registration is for 21 and 22 March 2017, max. participants : 24 (left: 0)

 

Detailed informations: PDF

 

Deadline for registrations: 15.03.2017

 

 

 

The registration deadline is over. Registrations are no longer possible.