Lecture Series on Advanced Microscopy
This lecture introduces the physical basics of microscopy and covers most aspects of modern microscopy: Wide field light microscopy for fixed and live samples, fluorescence microscopy, confocal microscopy for volume resolution, super resolution microscopy, atomic force microscopy, stereology, transmission electron microscopy (EM), scanning EM, cryo-EM and x-ray micro-tomography.
Passing the exam of this lecture qualifies for attending the PhD program Cutting Edge Microscopy, the MIC Workshops and the MIC Journal Club.
Registration on KSL
Detailed information
Time
Fall semester
Target audience
PhD students
Master students
All students, who have registered in KSL, are automatically added as a course member to ILIAS. If you encounter access problems to ILIAS or KSL, please contact info.mic@unibe.ch. Each lecture is accompanied by two handouts: 1) A summary of the lecture content and 2) self-test questions. These files will be available for download in ILIAS 24 hours prior to the respective lecture.