Microscopy Imaging Center

Lecture Series on Advanced Microscopy

This lecture introduces the physical basics of microscopy and covers most aspects of modern microscopy: Wide field light microscopy for fixed and live samples, fluorescence microscopy, confocal microscopy for volume resolution, super resolution microscopy, atomic force microscopy, stereology, transmission electron microscopy (EM), scanning EM, cryo-EM and x-ray micro-tomography.

Passing the exam of this lecture qualifies for attending the PhD program Cutting Edge Microscopy, the MIC Workshops and the MIC Journal Club.

Registration on KSL


Detailed information

Link to ILIAS


Fall semester

Target audience

PhD students
Master students

All students, who have registered in KSL, are automatically added as a course member to ILIAS. If you encounter access problems to ILIAS or KSL, please contact info.mic@unibe.ch. Each lecture is accompanied by two handouts: 1) A summary of the lecture content and 2) self-test questions. These files will be available for download in ILIAS 24 hours prior to the respective lecture.